CAMECA Scientific Instruments measure and Image elemental composition, Isotopic Ratio at the surface of the solid objects. Very small amounts (micro or nano) of material are measured using Electrons, Ions or X-rays giving very sensitive data in PPB level and at times on atomic levels for a range of applications such as semiconductor manufacturing industry, research in the fields of planetary sciences, geology, materials and nuclear sciences as well as microbiology and environmental sciences
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Secondary Ion Mass Spectrometer (SIMS) :
IMS 7F Universal Magnetic Sector SIMS : Used in Semiconductor R & D, Materials, Nuclear Sciences, environmental applications. Provides high sensitivity Trace Element Depth Profiling and Secondary Ion Microscopy, PPB level detection limits. High throughput and consistent reliability are the strong points. IMS 7 F Geo and IMS 7FR and the specific versions.
IMS 1280 : Ultra High Sensitivity SIMS used in Nuclear particle analysis, Geochronology and trace element analysis. Sub-permil external reproducibility with high sensitivity.
NanoSIMS 50: Optimised for High Lateral Resolution while maintaining High Sensitivity at High Mass resolution. Simultaneous detection of upto 7 Species. Used in Material Science, Geology, Cosmochemistry, Environmental Biology and cell biology.
Atom Probe Tomography LEAP 4000 HR/Si:
A unique 3D imaging mass spectrometer measuring, quantitatively, the elemental composition of samples with near-atomic resolution. The LEAP 4000 HR is a voltage pulsing only instrument. The LEAP 4000 X HR and LEAP 4000 X Si have ultra small spot UV laser pulsing as well as voltage pulsing capability. The LEAP Si provides fast acquisition time for microelectronics professionals.
The LEAP HR offers high mass resolution even in HV pulsing mode while maintaining a wide field of view. It is ideal for metals and advanced materials applications requiring high mass differentiation and flexibility.
SXFive / SXFiveFE: CAMECA’s fifth generation EPMA, now with Field Emission Source.
Available in 2 configurations, SXFive and SXFiveFE, our new EPMA delivers highest quality trace and minor element analysis for a wide range of Materials and Geoscience applications. Precise, qualitative and quantitative measurement and mapping of elemental composition with a new, versatile column compatible with Field emission Source.